臥式投影儀能(neng)高效率(lv)地檢測各(ge)種形(xing)狀(zhuang)復雜工(gong)件的輪(lun)(lun)廓尺寸和(he)(he)表(biao)面形(xing)狀(zhuang)。如樣板(ban)、沖壓件、凸輪(lun)(lun)、螺紋(wen)、齒輪(lun)(lun)、成形(xing)銑刀等(deng)各(ge)種工(gong)具、刀具和(he)(he)零件、以及端子、鐘表(biao)、金(jin)剛(gang)石等(deng),被廣泛的應用于(yu)機械、儀表(biao)、電子、輕(qing)工(gong)等(deng)行業,院(yuan)校、研究所以及計量(liang)檢定部(bu)門(men)的計量(liang)室(shi)、試驗(yan)室(shi)和(he)(he)生產車間。臥(wo)式投影儀是(shi)一(yi)種精密(mi)電子產品,它(ta)集機械、液晶(jing)或DMD、電子電路(lu)技術于(yu)一(yi)體(ti)。
臥式投影儀主(zhu)要(yao)用(yong)(yong)(yong)來對(dui)(dui)復雜形狀工(gong)(gong)(gong)件(jian)(jian)進(jin)行測(ce)(ce)(ce)量(liang),如成型(xing)刀(dao)具、樣板、儀(yi)(yi)表(biao)零件(jian)(jian)、凸輪、電子元(yuan)件(jian)(jian)的(de)(de)(de)(de)(de)輪廓(kuo)形狀和表(biao)面(mian)尺(chi)(chi)寸等(deng)(deng)。應(ying)用(yong)(yong)(yong)光(guang)切(qie)法(見表(biao)面(mian)粗糙度測(ce)(ce)(ce)量(liang))測(ce)(ce)(ce)量(liang)的(de)(de)(de)(de)(de)投(tou)影(ying)(ying)(ying)儀(yi)(yi)還可(ke)(ke)測(ce)(ce)(ce)量(liang)汽輪機(ji)葉片等(deng)(deng)的(de)(de)(de)(de)(de)剖面(mian)幾何形狀。臥式(shi)(shi)投(tou)影(ying)(ying)(ying)儀(yi)(yi)一(yi)(yi)般采用(yong)(yong)(yong)透射式(shi)(shi)光(guang)學(xue)投(tou)影(ying)(ying)(ying)系(xi)統,但(dan)也(ye)有(you)帶有(you)反(fan)射式(shi)(shi)光(guang)學(xue)投(tou)影(ying)(ying)(ying)系(xi)統的(de)(de)(de)(de)(de)。前(qian)者(zhe)主(zhu)要(yao)用(yong)(yong)(yong)于測(ce)(ce)(ce)量(liang)薄工(gong)(gong)(gong)件(jian)(jian)的(de)(de)(de)(de)(de)輪廓(kuo)尺(chi)(chi)寸;后者(zhe)主(zhu)要(yao)用(yong)(yong)(yong)于測(ce)(ce)(ce)量(liang)工(gong)(gong)(gong)件(jian)(jian)端面(mian)上(shang)(shang)的(de)(de)(de)(de)(de)形狀和尺(chi)(chi)寸等(deng)(deng)。投(tou)影(ying)(ying)(ying)儀(yi)(yi)除了有(you)光(guang)學(xue)投(tou)影(ying)(ying)(ying)系(xi)統外,還有(you)類似(si)工(gong)(gong)(gong)具顯微鏡那樣的(de)(de)(de)(de)(de)坐標(biao)工(gong)(gong)(gong)作(zuo)(zuo)臺(簡稱工(gong)(gong)(gong)作(zuo)(zuo)臺)。測(ce)(ce)(ce)量(liang)時(shi)(shi),被(bei)測(ce)(ce)(ce)件(jian)(jian)放在工(gong)(gong)(gong)作(zuo)(zuo)臺上(shang)(shang),移(yi)動或轉(zhuan)(zhuan)動工(gong)(gong)(gong)作(zuo)(zuo)臺,使(shi)(shi)投(tou)影(ying)(ying)(ying)屏上(shang)(shang)的(de)(de)(de)(de)(de)標(biao)線對(dui)(dui)準被(bei)測(ce)(ce)(ce)長(chang)度的(de)(de)(de)(de)(de)起點或一(yi)(yi)邊。從讀(du)(du)數機(ji)構讀(du)(du)出(chu)工(gong)(gong)(gong)作(zuo)(zuo)臺的(de)(de)(de)(de)(de)坐標(biao)位置,再(zai)移(yi)動或轉(zhuan)(zhuan)動工(gong)(gong)(gong)作(zuo)(zuo)臺,使(shi)(shi)標(biao)線對(dui)(dui)準被(bei)測(ce)(ce)(ce)長(chang)度的(de)(de)(de)(de)(de)終點或另一(yi)(yi)邊,然后讀(du)(du)出(chu)工(gong)(gong)(gong)作(zuo)(zuo)臺的(de)(de)(de)(de)(de)坐標(biao)值(zhi)。兩(liang)次讀(du)(du)數值(zhi)之差就(jiu)是被(bei)測(ce)(ce)(ce)長(chang)度的(de)(de)(de)(de)(de)量(liang)值(zhi)。測(ce)(ce)(ce)角(jiao)時(shi)(shi)也(ye)常以(yi)轉(zhuan)(zhuan)動投(tou)影(ying)(ying)(ying)屏來對(dui)(dui)準。在投(tou)影(ying)(ying)(ying)屏上(shang)(shang)還可(ke)(ke)繪出(chu)被(bei)測(ce)(ce)(ce)長(chang)度帶有(you)公差帶的(de)(de)(de)(de)(de)放大(da)圖形,以(yi)此與(yu)投(tou)影(ying)(ying)(ying)屏上(shang)(shang)實際被(bei)測(ce)(ce)(ce)長(chang)度的(de)(de)(de)(de)(de)放大(da)圖形比(bi)較(jiao),檢(jian)驗其尺(chi)(chi)寸是否合格。此法可(ke)(ke)同時(shi)(shi)測(ce)(ce)(ce)量(liang)被(bei)測(ce)(ce)(ce)件(jian)(jian)上(shang)(shang)多個尺(chi)(chi)寸,效率較(jiao)高。